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Analyzing the Effect of Capillary Force on Vibrational Performance of the Cantilever of an Atomic Force Microscope in Tapping Mode with Double Piezoelectric Layers in an Air Environment

Published online by Cambridge University Press:  01 September 2015

Amir Nahavandi  and
Moharam Habibnejad Korayem
Amir Nahavandi
Affiliation:
Department of Mechanical and Aerospace Engineering, Science and Research Branch, Islamic Azad University, 1477893855 Tehran, Iran
Moharam Habibnejad Korayem*
Affiliation:
Department of Mechanical and Aerospace Engineering, Science and Research Branch, Islamic Azad University, 1477893855 Tehran, Iran
*
*Corresponding author. [email protected]
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Abstract

The aim of this paper is to determine the effects of forces exerted on the cantilever probe tip of an atomic force microscope (AFM). These forces vary according to the separation distance between the probe tip and the surface of the sample being examined. Hence, at a distance away from the surface (farther than don), these forces have an attractive nature and are of Van der Waals type, and when the probe tip is situated in the range of a0≤dts≤don, the capillary force is added to the Van der Waals force. At a distance of dts≤a0, the Van der Waals and capillary forces remain constant at intermolecular distances, and the contact repulsive force repels the probe tip from the surface of sample. The capillary force emerges due to the contact of thin water films with a thickness of hc which have accumulated on the sample and probe. Under environmental conditions a layer of water or hydrocarbon often forms between the probe tip and sample. The capillary meniscus can grow until the rate of evaporation equals the rate of condensation. For each of the above forces, different models are presented. The smoothness or roughness of the surfaces and the geometry of the cantilever tip have a significant effect on the modeling of forces applied on the probe tip. Van der Waals and the repulsive forces are considered to be the same in all the simulations, and only the capillary force is altered in order to evaluate the role of this force in the AFM-based modeling. Therefore, in view of the remarkable advantages of the piezoelectric microcantilever and also the extensive applications of the tapping mode, we investigate vibrational motion of the piezoelectric microcantilever in the tapping mode. The cantilever mentioned is entirely covered by two piezoelectric layers that carry out both the actuation of the probe tip and the measuringof its position.

Keywords

atomic force microscopecantileverdynamicscapillary forceextended piezoelectric layer
Type
Equipment and Software Development
Information
Microscopy and Microanalysis , Volume 21 , Issue 5 , October 2015 , pp. 1195 - 1206
Copyright
© Microscopy Society of America 2015 

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References

Adams, J.D., Parrott, G., Bauer, C., Sant, T., Manning, L., Jones, M., Rogers, B., McCorkle, D. & Ferrel, T.L. (2003). Nanowatt chemical vapor detection with a self-sensing, piezoelectric microcantilever array. J Appl Phys Lett 83, 3428.Google Scholar
Boisen, A., Thaysen, J., Jensenius, H. & Hansen, O. (2000). Environmental sensors based on micromachined cantilevers with integrated read-out. Ultramicroscopy 82, 1–11.Google Scholar
Butt, H.J. & Kappl, M. (2009). Normal capillary forces. J Adv Coll Interface Sci 146, 48–60.Google Scholar
Datskos, P.G., Thundat, T. & Lavrik, N.V. (2004). Micro and nanocantilever sensors. Encyclopedia Nanosci Nanotechnol X, 1.Google Scholar
Dong, W., Lu, X., Cui, Y., Wang, J. & Liu, M. (2007). Fabrication and characterization of microcantilever integrated with PZT thin film sensor and actuator. Thin Solid Films 515, 8544–8548.CrossRefGoogle Scholar
Ebrahimi, N. (2011). Dynamic analysis of tapping mode atomic force microscopy in liquid and air in nano scale. PhD Thesis. Iran University of Science and Technology.Google Scholar
Fung, R.F. & Huang, S.C. (2001). Dynamic modeling and vibration analysis of the atomic force microscope. J Vib Acoust 123, 502–509.CrossRefGoogle Scholar
Ghazavi, M.R., Rezazadeh, G. & Azizi, S. (2010). Pure parametric excitation of a micro cantilever beam actuated by piezoelectric layers. App Math Model 34, 4196–4207.Google Scholar
Hansma, H.G., Vesenka, J., Siegerist, C., Kelderman, G., Morrett, H., Sinsheimer, R.L., Elings, V., Bustamante, C. & Hansma, P.K. (1992). Reproducible imaging and dissection of plasmid DNA under liquid with the atomic force microscope. Science 256, 1180–1184.Google Scholar
Itoh, T., Ohashi, T. & Suga, T. (1996). Piezoelectric cantilever array for multiprobe scanning force microscopy. MEMS-9, pp. 451–455.Google Scholar
Itoh, T. & Suga, T. (1996). Self-excited force sensing microcantilevers with piezoelectric thin films for dynamic scanning force microscopy. Sensors Actuators A Phys 54, 477–481.Google Scholar
Korayem, M.H., Kavousi, A. & Ebrahimi, N. (2010). Dynamic analysis of tapping-mode AFM considering capillary force interaction. Sci Iran 18(1), 121–129.Google Scholar
Korayem, M.H. & Zakeri, M. (2009). Sensitivity analysis of nanoparticles pushing critical conditions in 2-D controlled nanomanipulation based on AFM. Int J Adv Manuf Technol 41, 714.CrossRefGoogle Scholar
Lee, C., Itoh, T., Ohashi, T., Maeda, R. & Suga, T. (1997). AFM and LFM using piezoresistive cantilever. J Vac Sci Technol B 15, 1559.CrossRefGoogle Scholar
Lee, C., Itoh, T. & Suga, T. (1999). Self-excited piezoelectric PZT microcantilevers for dynamic SFM with inherent sensing and actuating capabilities. Sensors Actuators A Phys 72, 179–188.CrossRefGoogle Scholar
Liu, M.W., Tong, J.H., Wang, J., Dong, W.J., Cui, T.H. & Wang, L.D. (2006). Theoretical analysis of the sensing and actuating effects of piezoelectric multimorph cantilevers. Microsyst Technol 12, 335–342.Google Scholar
Mahmodi, S.N. & Jalili, N. (2007). Non-linear vibration and frequency response analysis of piezoelectrically driven microcantilevers. Int J Nonlinear Mech 42, 577–587.Google Scholar
Nayfeh, A., Nayfeh, J.F. & Mook, D.T. (1992). On methods for continuous systems with quadratic and cubic nonlinearities. Nonlinear Dyn 3, 145–162.CrossRefGoogle Scholar
Putman, C.A., Vander Werf, K.O., De Grooth, B.G., Van Hulst, N.F. & Greve, J. (1994). Tapping mode atomic force microscopy in liquid. Appl Phys Lett 64, 2454–2456.Google Scholar
Rogers, B., Manning, L., Sulchek, T. & Adams, J.D. (2004). Improving tapping mode atomic force microscopy with piezoelectric cantilevers. Ultramicroscopy 100, 267–276.CrossRefGoogle ScholarPubMed
Salehi-Khojin, A., Jalili, N. & Mahmoodi, S.N. (2009). Vibration analysis of vector piezoresponse force microscopy with coupled flexural-longitudinal and lateral-torsional motions. J Sound Vibration 322, 1081–1099.CrossRefGoogle Scholar
Sarid, D., Ruskell, T.G., Workman, R.K. & Cheng, D.. (1997). Driven nonlinear atomic force microscopy cantilevers: From noncontact to tapping modes of operation. J Vac Sci Technol B 14, 864.Google Scholar
Tortonese, M., Yamada, H., Barett, R.C & Quate, C.F. (1991). Atomic force microscopy using a piezoresistive cantilever. Digest of Technical Papers, Sixth Intl. Conf. Solid-State Sensors and Actuators, Transducers '91, San Francisco, CA, June 24–28, 1991, pp. 448–451.Google Scholar
Wolf, K. & Gottlieb, O. (2002). Nonlinear dynamics of a noncontacting atomic force microscope cantilever actuated by a piezoelectric layer. J Appl Phys 91, 4701.Google Scholar