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An STM With A Time-Of-Flight Analyzer For Atomic Species Identification

Published online by Cambridge University Press:  02 July 2020

U. Weierstall  and
J.C.H. Spence
U. Weierstall
Affiliation:
Department of Physics and Astronomy, Arizona State University, Tempe, AZ85287. USA.
J.C.H. Spence
Affiliation:
Department of Physics and Astronomy, Arizona State University, Tempe, AZ85287. USA.
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Extract

The local chemistry of many surface reactions is unknown, since no techniques exist for identifying atom types at individual defect sites on extended crystal surfaces. An STM has therefore been constructed which allows atomic clusters of interest to be transferred into a time-of-flight spectrometer for species identification. Atoms are first transferred from the STM sample to the tip, using a small voltage pulse. The sample is then removed, and these atoms ejected into a time-of-flight (TOF) analyzer for mass identification. A 75mm flat Chevron MCP is used as TOF-detector. The output is led to a digital oscilloscope, whose trace is triggered by the tip pulse. Scope, triggering and high voltage are under Labview control, spectra are transferred into the PC and the mass to charge ratio of the ionized species is calculated. The STM has a vertical axis and is based on the Burleigh Inchworm with tube scanner for sample movement.

Type
Scanned Probe Microscopy
Information
Microscopy and Microanalysis , Volume 6 , Issue S2: Proceedings: Microscopy & Microanalysis 2000, Microscopy Society of America 58th Annual Meeting, Microbeam Analysis Society 34th Annual Meeting, Microscopical Society of Canada/Societe de Microscopie de Canada 27th Annual Meeting, Philadelphia, Pennsylvania August 13-17, 2000 , August 2000 , pp. 718 - 719
Copyright
Copyright © Microscopy Society of America

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References

1. Spence, , Weierstall, U. and Lo, W., Atomic species identification in scanning tunneling microscopy by time of flight spectroscopy, J. Vac. Sci. Tech. B14(3), (1996) 1587–1590CrossRefGoogle Scholar

2. Miller, M. and Smith, D. A., Atom Probe Microanalysis(Materials Research Society) 1989Google Scholar

3. Weierstall, U. and Spence, J.C.H., Atom species identification in STM using an Imaging Atom-Probe technique, Surface Science 398 (1998) 267–279CrossRefGoogle Scholar

4. Sijbrandij, S.J., Cerezo, A., Smith, G.D.W., Improvements in the transmission of voltage evaporation pulses in the atom probe, Appl. Surf. Sci. 87/88 (1995) 414–420CrossRefGoogle Scholar