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An Open-Source Engine for the Processing of Electron Backscatter Patterns: EBSD-Image

Published online by Cambridge University Press:  06 May 2011

Philippe T. Pinard ,
Marin Lagacé ,
Pierre Hovington ,
Denis Thibault  and
Raynald Gauvin
Philippe T. Pinard*
Affiliation:
Materials and Mining Engineering Department, McGill University, 3610 University Street, Montreal, Quebec H3A 2B2, Canada
Marin Lagacé
Affiliation:
Materials Science Department, Institut de recherche d'Hydro-Québec, 1800 Lionel-Boulet Boulevard, Varennes, Québec J3Z 1S1, Canada
Pierre Hovington
Affiliation:
Materials Science Department, Institut de recherche d'Hydro-Québec, 1800 Lionel-Boulet Boulevard, Varennes, Québec J3Z 1S1, Canada
Denis Thibault
Affiliation:
Materials Science Department, Institut de recherche d'Hydro-Québec, 1800 Lionel-Boulet Boulevard, Varennes, Québec J3Z 1S1, Canada
Raynald Gauvin
Affiliation:
Materials and Mining Engineering Department, McGill University, 3610 University Street, Montreal, Quebec H3A 2B2, Canada
*
Corresponding author. E-mail: [email protected]
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Abstract

An open source software package dedicated to processing stored electron backscatter patterns is presented. The package gives users full control over the type and order of operations that are performed on electron backscatter diffraction (EBSD) patterns as well as the results obtained. The current version of EBSD-Image (www.ebsd-image.org) offers a flexible and structured interface to calculate various quality metrics over large datasets. It includes unique features such as practical file formats for storing diffraction patterns and analysis results, stitching of mappings with automatic reorganization of their diffraction patterns, and routines for processing data on a distributed computer grid. Implementations of the algorithms used in the software are described and benchmarked using simulated diffraction patterns. Using those simulated EBSD patterns, the detection of Kikuchi bands in EBSD-Image was found to be comparable to commercially available EBSD systems. In addition, 24 quality metrics were evaluated based on the ability to assess the level of deformation in two samples (copper and iron) deformed using 220 grit SiC grinding paper. Fourteen metrics were able to properly measure the deformation gradient of the samples.

Keywords

EBSDpost-processingEBSPimage qualityimage analysisdeformation
Type
Electron Backscatter Diffraction Special Section
Information
Microscopy and Microanalysis , Volume 17 , Issue 3 , June 2011 , pp. 374 - 385
Copyright
Copyright © Microscopy Society of America 2011

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