Hostname: page-component-586b7cd67f-t7czq Total loading time: 0 Render date: 2024-11-28T11:50:32.088Z Has data issue: false hasContentIssue false
  • English
  • Français

An Interferometric Electron Ruler with Picometer Accuracy in Gauaging Lattice Displacement

Published online by Cambridge University Press:  02 July 2020

Lijun Wu ,
Yimei Zhu  and
J. Tafto
Lijun Wu
Affiliation:
Materials Science Division, Brookhaven National Laboratory, Upton, NY, 11973
J. Tafto
Affiliation:
Materials Science Division, Brookhaven National Laboratory, Upton, NY, 11973
Get access

Abstract

We report a novel technique to accurately measure interfacial lattice displacement by forming an electron probe close to a specimen in a manner similar to that originally proposed by Gabor to record a hologram. This method is based on the quantitative analysis of the interference pattern of shadow images in coherent electron diffraction. The approach is unique in that there are no adjustable microscope parameters, the contrast is strong even when the fault is viewed edge-on, and a large number of shadow images of the fault corresponding to different Bragg reflections can be studied simultaneously. Since it is an interferometric technique, the spatial resolution of the measurement is not limited by the wavelength of the fast electrons. An accuracy down to 1pm has been demonstrated in measuring the displacement associated stacking faults and grain boundaries in superconductors. It is, to our knowledge, the highest that has been achieved in measurements of displacement vectors.

Type
Quantitative Transmission Electron Microscopy of Interfaces (Organized by M. Rüehle, Y. Zhu and U. Dahmen)
Information
Microscopy and Microanalysis , Volume 7 , Issue S2: Proceedings: Microscopy & Microanalysis 2001, Microscopy Society of America 59th Annual Meeting, Microbeam Analysis Society 35th Annual Meeting, Long Beach, California August 5-9, 2001 , August 2001 , pp. 282 - 283
Copyright
Copyright © Microscopy Society of America 2001

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1.Gabor, D., Nature (London) 161, 777 (1948).CrossRefGoogle Scholar
2.Wu, L., Zhu, Y. and Tafto, J., Phys. Rev. Lett. 85, 5126 (2000).CrossRefGoogle Scholar
3.Work supported by Division of Materials Sciences, DOE, under DE-AC02-98CH10886.Google Scholar