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Alloy Compositions in Model Bimetallic Catalysts

Published online by Cambridge University Press:  02 July 2020

S.-C.Y. Tsen ,
P. A. Crozier  and
J. Liua
S.-C.Y. Tsen
Affiliation:
Center for Solid State Science, Arizona State University, Tempe, AZ, 85287-1704
P. A. Crozier
Affiliation:
Center for Solid State Science, Arizona State University, Tempe, AZ, 85287-1704
J. Liua
Affiliation:
Monsanto Company, 800 N. Lindbergh Ave, U1E, St Louis, MO, 63167
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Abstract

For supported bimetallic catalysts it is important to know if the metal components are present in the form of ordered alloys or metal mixtures. For metals with similar crystal structure, Vegard's law predicts a simple relationship between alloy composition and lattice dimensions [1]. It is therefore possible to use high-resolution electron microscopy (HREM) to provide both structural and compositional information. in nanometer sized particles, accurate determination of the lattice spacing from fringes in an HREM image is difficult because of errors due to signal-to-noise, particle tilt and edge effects [2,3]. However, statistical distributions of fringe spacing can be used to determine the lattice spacing of particle ensembles to within 1.5% when measurements are carried out on at least 100 particles [2]. We extend this technique with model AuPd bimetallic catalysts and show that Vegard's law applies to nanometer-sized particles.

Model bimetallic catalysts were prepared by sputtering metal from AuPd alloy targets and/or a Pd target onto thin amorphous carbon substrates.

Type
Characterization of Catalysts (Organized by S. Bradley)
Information
Microscopy and Microanalysis , Volume 7 , Issue S2: Proceedings: Microscopy & Microanalysis 2001, Microscopy Society of America 59th Annual Meeting, Microbeam Analysis Society 35th Annual Meeting, Long Beach, California August 5-9, 2001 , August 2001 , pp. 1078 - 1079
Copyright
Copyright © Microscopy Society of America 2001

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References

references

1.Barret, C. S.et al., The Structure of Metals, McGraw-Hill, New York (1966)372.Google Scholar
2.Crozier, P. A.et al., J. Electron Microscopy, 48 (1999) 1015.Google Scholar
3.Malm, J. O.et al., Ultramicroscopy, 68 (1997) 13.CrossRefGoogle Scholar