Hostname: page-component-78c5997874-g7gxr Total loading time: 0 Render date: 2024-11-09T15:26:38.514Z Has data issue: false hasContentIssue false
  • English
  • Français

AEM and HRTEM Analysis of the Metal-Oxide Interface of Zircaloy-4, Prepared by FIB

Published online by Cambridge University Press:  02 July 2020

S. Abolhassani ,
R. Schäublin ,
F. Groeschel  and
G. Bart
S. Abolhassani
Affiliation:
Laboratory for Materials Behavior, Paul Scherrer Institut, 5232, Villigen-PSl, Switzerland.
R. Schäublin
Affiliation:
Centre de Recherche de Physique de Plasmas, Fusion Technology-Materials, Ecole Polytechnique Federale de Lausanne, 5232, Villigen-PSl, Switzerland.
F. Groeschel
Affiliation:
Laboratory for Materials Behavior, Paul Scherrer Institut, 5232, Villigen-PSl, Switzerland.
G. Bart
Affiliation:
Laboratory for Materials Behavior, Paul Scherrer Institut, 5232, Villigen-PSl, Switzerland.
Get access

Abstract

The understanding of the mechanism of oxidation of Zircaloy materials provides an important support for the corrosion control of the fuel claddings in the light water nuclear reactors. Many investigations are devoted to the study of the oxidation of these materials. One of the important aspects of these studies, is the analysis of the metal-oxide interface, which produces information about the nature of the oxide formed at the interface, at different stages of oxidation and the influence of the oxide structure and morphology on the formation and growth of the oxide.

In the present study, analytical electron microscopy (AEM) and high resolution transmission electron microscopy (HRTEM) are used to examine the metal-oxide interface of an un-irradiated Zircaloy-4 material, oxidized in autoclave, under pressurized water reactor conditions.

The TEM specimen preparation for the interface analysis is an important step of the investigation, since the transverse section required for such observation should be sufficiently thin exactly at the position of the interface.

Type
Quantitative Transmission Electron Microscopy of Interfaces (Organized by M. Rüehle, Y. Zhu and U. Dahmen)
Information
Microscopy and Microanalysis , Volume 7 , Issue S2: Proceedings: Microscopy & Microanalysis 2001, Microscopy Society of America 59th Annual Meeting, Microbeam Analysis Society 35th Annual Meeting, Long Beach, California August 5-9, 2001 , August 2001 , pp. 250 - 251
Copyright
Copyright © Microscopy Society of America 2001

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1.Garzarolli, .F. et al., Proc. 11th International Symposium on Zirconium in the Nuclear Industry, (1996) 12.Google Scholar
2.Pétigny, N. et al., J. Nucl. Mat., 280 (2000) 318.CrossRefGoogle Scholar
3.The authors wish to thank Dr. R. K. Münsch, for supplying the material for the present study. Dr. L. Peto (MICRION, UK), is thanked for the FIB specimen preparation and Dr. M. Cantoni (CIME-EPFI.) for Philips CMMH) operation.Google Scholar