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Advances in Low and Ultra-Low Energy, High-Resolution SEM

Published online by Cambridge University Press:  03 August 2008

L Roussel ,
DJ Stokes ,
RJ Young  and
I Gestmann
L Roussel
Affiliation:
FEI Company, The Netherlands
DJ Stokes
Affiliation:
FEI Company, The Netherlands
RJ Young
Affiliation:
FEI Company, USA
I Gestmann
Affiliation:
FEI Company, The Netherlands
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Type
Research Article
Information
Microscopy and Microanalysis , Volume 14 , Supplement S2 , August 2008 , pp. 1218 - 1219
Copyright
© 2008 Microscopy Society of America

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