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Advanced Analysis of spherical SiO2 Aerosol Nanoparticles with a high-resolution SEM

Published online by Cambridge University Press:  23 November 2012

D. Hodoroaba ,
S. Benemann ,
C. Motzkus ,
T. Macé ,
P. Palmas  and
S. Vaslin-Reimann
D. Hodoroaba
Affiliation:
BAM Federal Institute for Materials Research and Testing, Berlin, Germany
S. Benemann
Affiliation:
BAM Federal Institute for Materials Research and Testing, Berlin, Germany
C. Motzkus
Affiliation:
LNE National Metrology and Testing Laboratory, Paris, France
T. Macé
Affiliation:
LNE National Metrology and Testing Laboratory, Paris, France
P. Palmas
Affiliation:
LNE National Metrology and Testing Laboratory, Paris, France
S. Vaslin-Reimann
Affiliation:
LNE National Metrology and Testing Laboratory, Paris, France
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 1750 - 1751
Copyright
Copyright © Microscopy Society of America 2012

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