Hostname: page-component-586b7cd67f-r5fsc Total loading time: 0 Render date: 2024-11-29T13:12:37.886Z Has data issue: false hasContentIssue false
  • English
  • Français

Aberration-corrected High Resolution Transmission Electron Microscopy of [(SnSe)]m[MoSe2]n films

Published online by Cambridge University Press:  23 November 2012

S. Rouvimov ,
K. Langworthy ,
W. Neumann ,
D.C. Johnson  and
M. Beekman
S. Rouvimov
Affiliation:
Physics, Portland State University, Portland, OR
K. Langworthy
Affiliation:
University of Oregon, Eugene, OR
W. Neumann
Affiliation:
University of Oregon, Eugene, OR
D.C. Johnson
Affiliation:
University of Oregon, Eugene, OR
M. Beekman
Affiliation:
Oregon Institute of Technology, Klamath Falls, OR
Get access

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 1630 - 1631
Copyright
Copyright © Microscopy Society of America 2012

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)