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Aberration-Corrected STEM for Elemental Mapping

Published online by Cambridge University Press:  16 July 2003

N. Dellby ,
O.L. Krivanek ,
M. Murfitt ,
P.D. Nellist  and
Z.S. Szilagyi
N. Dellby
Affiliation:
Nion Co., 1102 8, thSt., Kirkland, WA 98033, USA
O.L. Krivanek
Affiliation:
Nion Co., 1102 8, thSt., Kirkland, WA 98033, USA
M. Murfitt
Affiliation:
Nion Co., 1102 8, thSt., Kirkland, WA 98033, USA
P.D. Nellist
Affiliation:
Nion Co., 1102 8, thSt., Kirkland, WA 98033, USA
Z.S. Szilagyi
Affiliation:
Nion Co., 1102 8, thSt., Kirkland, WA 98033, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 9 , Issue S02 , August 2003 , pp. 924 - 925
Copyright
Copyright © Microscopy Society of America 2003