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Aberration-Corrected Four-Detector STEM-EDS Analysis of Embedded Nanoclusters

Published online by Cambridge University Press:  27 August 2014

Chad M. Parish  and
Michael K. Miller

Abstract

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Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 568 - 569
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Miller, M. K.and Parish, C. M. Mater. Sci Tech., 27[4] (2011) p. 729.Google Scholar
[2] Egerton, R. F., et al., Ultramicrosc., 110 (2010) p. 991.Google Scholar
[3] Parish, C. M.and Miller, M. K. Microsc. Microan., in press.Google Scholar
[4] Kotula, P. G., et al., Microsc. Microan., 18[4] (2012) p. 691.Google Scholar
[5] Kotula, P. G., et al., Microsc. Microan., 9[1] (2003) p. 1.Google Scholar
[6] Research sponsored by the Materials Sciences and Engineering Division, Office of Basic Energy Sciences, U.S. Department of Energy. We acknowledge the use of the Analytical Instrumentation.Google Scholar