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Aberration Correction and Electron Holography

Published online by Cambridge University Press:  05 July 2010

Hannes Lichte ,
Martin Linck ,
Dorin Geiger  and
Michael Lehmann
Hannes Lichte*
Affiliation:
Triebenberg Laboratory, Institute of Structure Physics, Technische Universitaet Dresden, Germany
Martin Linck
Affiliation:
Triebenberg Laboratory, Institute of Structure Physics, Technische Universitaet Dresden, Germany
Dorin Geiger
Affiliation:
Triebenberg Laboratory, Institute of Structure Physics, Technische Universitaet Dresden, Germany
Michael Lehmann
Affiliation:
Institut für Optik und Atomare Physik, Technische Universitaet Berlin, Berlin, Germany
*
Corresponding author. E-mail: [email protected]
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Abstract

Electron holography has been shown to allow a posteriori aberration correction. Therefore, an aberration corrector in the transmission electron microscope does not seem to be needed with electron holography to achieve atomic lateral resolution. However, to reach a signal resolution sufficient for detecting single light atoms and very small interatomic fields, the aberration corrector has turned out to be very helpful. The basic reason is the optimized use of the limited number of “coherent” electrons that are provided by the electron source, as described by the brightness. Finally, quantitative interpretation of atomic structures benefits from the holographic facilities of fine-tuning of the aberration coefficients a posteriori and from evaluating both amplitude and phase.

Keywords

aberration correctionelectron holographyTEMphase contrastphase detection limitsignal-to-noise ratioatomic resolution
Type
Special Section—Aberration-Corrected Electron Microscopy
Information
Microscopy and Microanalysis , Volume 16 , Issue 4 , August 2010 , pp. 434 - 440
Copyright
Copyright © Microscopy Society of America 2010

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References

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