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4D-STEM Imaging With the pnCCD (S)TEM-Camera

Published online by Cambridge University Press:  23 September 2015

M. Simson ,
H. Ryll ,
H. Banba ,
R. Hartmann ,
M. Huth ,
S. Ihle ,
L. Jones ,
Y. Kondo ,
K. Muller  and
P.D. Nellist
...Show all authors
M. Simson
Affiliation:
PNDetector GmbH, SckellstraBe 3, 81667 Munchen, Germany
H. Ryll
Affiliation:
PNSensor GmbH, Otto-Hahn-Ring 6, 81739 Munchen, Germany
H. Banba
Affiliation:
JEOL Ltd.,3-1-2 Musashino Akishima Tokyo 196-8558, Japan
R. Hartmann
Affiliation:
PNSensor GmbH, Otto-Hahn-Ring 6, 81739 Munchen, Germany
M. Huth
Affiliation:
PNSensor GmbH, Otto-Hahn-Ring 6, 81739 Munchen, Germany
S. Ihle
Affiliation:
PNSensor GmbH, Otto-Hahn-Ring 6, 81739 Munchen, Germany
L. Jones
Affiliation:
Department of Materials, University of Oxford, 13 Parks Road, Oxford OX13PH, UK
Y. Kondo
Affiliation:
JEOL Ltd.,3-1-2 Musashino Akishima Tokyo 196-8558, Japan
K. Muller
Affiliation:
Universitat Bremen, Otto-Hahn-Allee 1, 28359 Bremen, Germany
P.D. Nellist
Affiliation:
Department of Materials, University of Oxford, 13 Parks Road, Oxford OX13PH, UK
R. Sagawa
Affiliation:
JEOL Ltd.,3-1-2 Musashino Akishima Tokyo 196-8558, Japan
J. Schmidt
Affiliation:
PNSensor GmbH, Otto-Hahn-Ring 6, 81739 Munchen, Germany
H. Soltau
Affiliation:
PNDetector GmbH, SckellstraBe 3, 81667 Munchen, Germany
L. Striider
Affiliation:
PNSensor GmbH, Otto-Hahn-Ring 6, 81739 Munchen, Germany
H. Yang
Affiliation:
Department of Materials, University of Oxford, 13 Parks Road, Oxford OX13PH, UK

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 2211 - 2212
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Ryll, H., et al., Microscopy and Microanalysis 19 (2013). p. 1160–1161.Google Scholar
[2] Rodenburg, J.M., McCallum, B.C. & Nellist, P.D., Ultramicroscopy. 48 (1993) 304–314.CrossRefGoogle Scholar
[3] Yang, H., et al., Ultramicroscopy. doi:10.1016/j.ultramic.2014.10.013.Google Scholar
[4] Muller, K., et al., Appl. Phys. Lett. 101 (2012). p. 2121101–2121104.Google Scholar