Hostname: page-component-586b7cd67f-t7czq Total loading time: 0 Render date: 2024-11-24T23:18:27.538Z Has data issue: false hasContentIssue false
  • English
  • Français

3D non-destructive grain orientation mapping of polycrystalline materials using 3D-XRD and TEM

Published online by Cambridge University Press:  23 November 2012

X. Huang ,
H.F. Poulsen ,
S. Schmidt ,
H.H. Liu  and
A. Godfrey
X. Huang
Affiliation:
Technical University of Denmark, Roskilde, Denmark
H.F. Poulsen
Affiliation:
Technical University of Denmark, Roskilde, Denmark
S. Schmidt
Affiliation:
Technical University of Denmark, Roskilde, Denmark
H.H. Liu
Affiliation:
California Institute of Technology, Pasadena, CA
A. Godfrey
Affiliation:
Tsinghua University, Beijing, China
Get access

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 728 - 729
Copyright
Copyright © Microscopy Society of America 2012

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)