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3D Nanoscale Analysis of Implanted Deuterium in Tungsten using Atom Probe Tomography

Published online by Cambridge University Press:  22 July 2022

Martin S. Meier ,
Paul A. J. Bagot ,
Anthony Hollingsworth ,
Anke Wohlers ,
Michael P. Moody  and
Daniel Haley
Martin S. Meier*
Affiliation:
Department of Materials, University of Oxford, 16 Parks Road, Oxford, OX1 3PH, United Kingdom
Paul A. J. Bagot
Affiliation:
Department of Materials, University of Oxford, 16 Parks Road, Oxford, OX1 3PH, United Kingdom
Anthony Hollingsworth
Affiliation:
UKAEA – United Kingdom Atomic Energy Authority, CCFE, Culham Science Centre, Abingdon, Oxon, OX14 3DB, United Kingdom
Anke Wohlers
Affiliation:
UKAEA – United Kingdom Atomic Energy Authority, CCFE, Culham Science Centre, Abingdon, Oxon, OX14 3DB, United Kingdom
Michael P. Moody
Affiliation:
Department of Materials, University of Oxford, 16 Parks Road, Oxford, OX1 3PH, United Kingdom
Daniel Haley
Affiliation:
Department of Materials, University of Oxford, 16 Parks Road, Oxford, OX1 3PH, United Kingdom
*
*Corresponding author: [email protected]

Abstract

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Type
Correlative Microscopy and High-Throughput Characterization for Accelerated Development of Materials in Extreme Environments
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 2102 - 2104
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Copyright
Copyright © Microscopy Society of America 2022

References

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