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3D Elemental Mapping by Array Tomography Particle Analysis

Published online by Cambridge University Press:  01 August 2018

Yuuki Yamaguchi
Affiliation:
JEOL Ltd. Electron Optics Division 3-1-2 Musashino, Akishima, Tokyo196-8558JAPAN
Hirobumi Morita
Affiliation:
Oxford instruments KK. 3-32-42 Higashi-Shinagawa, Shinagawa-ku, Tokyo140-0002JAPAN
Yukari Moriya
Affiliation:
JEOL Ltd. Electron Optics Division 3-1-2 Musashino, Akishima, Tokyo196-8558JAPAN
Chikako Nakayama
Affiliation:
JEOL Ltd. Electron Optics Division 3-1-2 Musashino, Akishima, Tokyo196-8558JAPAN
Tomohiro Haruta
Affiliation:
JEOL Ltd. Electron Optics Division 3-1-2 Musashino, Akishima, Tokyo196-8558JAPAN
Mitsuo Suga
Affiliation:
JEOL Ltd. Electron Optics Division 3-1-2 Musashino, Akishima, Tokyo196-8558JAPAN
Natasha Erdman
Affiliation:
JEOL USA, INC. 11 Dearborn Road Peabody, MA01960USA
Shunsuke Asahina
Affiliation:
JEOL Ltd. Electron Optics Division 3-1-2 Musashino, Akishima, Tokyo196-8558JAPAN

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2018 

References

[1] Micheva, K. D Smith, S. J. Neuron 55(1 2007) p 25.Google Scholar
[2] Horstmann, H., et al, PLoS One. 7(4 2012 e35172.Google Scholar
[3] Koga, D., et al, Microscopy 65(2 2016) p 145.Google Scholar
[4] Yamaguchi, Y., et al, Microsc. Microanal. 23(Suppl 1 2017) p 1180.Google Scholar