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On Demand - Electron Microscopy of Beam Sensitive Samples: The Trials and Tribulations of Electron-Beam Sample Interactions
Chen, F.-R., Van Dyck, D., Kisielowski, C., Hansen, L.P., Barton, B., Helveg, S., Nature Commun. 12 (2021), p. 5007. doi:10.1038/s41467-021-24857Google Scholar
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