Hostname: page-component-586b7cd67f-dlnhk Total loading time: 0 Render date: 2024-11-28T17:57:26.744Z Has data issue: false hasContentIssue false
  • English
  • Français

200 kV TEM with a Zernike Phase Plate

Published online by Cambridge University Press:  01 August 2005

S Motoki ,
F Hosokawa ,
Y Arai ,
R Danev  and
K Nagayama
S Motoki
Affiliation:
JEOL Ltd., Tokyo, Japan
F Hosokawa
Affiliation:
JEOL Ltd., Tokyo, Japan
Y Arai
Affiliation:
JEOL Ltd., Tokyo, Japan
R Danev
Affiliation:
Okazaki National Research Institute, Japan
K Nagayama
Affiliation:
Okazaki National Research Institute, Japan

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 11 , Issue S02 , August 2005 , pp. 708 - 709
Copyright
© 2005 Microscopy Society of America