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200 kV TEM with a Zernike Phase Plate

Published online by Cambridge University Press:  01 August 2005

S Motoki ,
F Hosokawa ,
Y Arai ,
R Danev  and
K Nagayama
S Motoki
Affiliation:
JEOL Ltd., Tokyo, Japan
F Hosokawa
Affiliation:
JEOL Ltd., Tokyo, Japan
Y Arai
Affiliation:
JEOL Ltd., Tokyo, Japan
R Danev
Affiliation:
Okazaki National Research Institute, Japan
K Nagayama
Affiliation:
Okazaki National Research Institute, Japan

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 11 , Issue S02 , August 2005 , pp. 708 - 709
Copyright
© 2005 Microscopy Society of America