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Grain growth and texture development in lithium fluoride thin films

Published online by Cambridge University Press:  31 January 2011

Hakkwan Kim  and
Alexander H. King
Hakkwan Kim*
Affiliation:
School of Materials Engineering, Purdue University, West Lafayette, Indiana 47907-2044
Alexander H. King
Affiliation:
School of Materials Engineering, Purdue University, West Lafayette, Indiana 47907-2044
*
a) Address all correspondence to this author. e-mail: [email protected]
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Abstract

We have studied grain-growth and texture development in polycrystalline lithium fluoride thin films using dark-field transmission electron microscopy. We demonstrate that we can isolate the size distribution of 〈111〉 surface normal grains from the overall size distribution, based on simple and plausible assumptions about the texture. The {111} texture formation and surface morphology were also observed by x-ray diffraction and atomic force microscopy, respectively. The grain-size distributions become clearly bimodal as the annealing time increases, and we deduce that the short-time size distributions are also a sum of two overlapping peaks. The smaller grain-size peak in the distribution corresponds to the {111}-oriented grains, which do not grow significantly, while all other grains increase in size with annealing time. A novel feature of the LiF films is that the {111} texture component strengthens with annealing, despite the absence of growth for these grains, through the continued nucleation of new grains.

Keywords

Nucleation & growthTextureTransmission electron microscopy (TEM)
Type
Articles
Information
Journal of Materials Research , Volume 23 , Issue 2 , February 2008 , pp. 452 - 462
Copyright
Copyright © Materials Research Society 2007

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