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GILFRICH, J. V., NOYAN, I. C., JENKINS, R., HUANG, T. C., SNYDER, R. L., SMITH, D. K., ZAITZ, M. A. & PREDECKI, P. K. (eds) 1998. Advances in X-Ray Analysis, Volume 39. Proceedings of the 44th Annual Conference on Applications of X-Ray Analysis, held July 31–August 4, 1995, in Colorado Springs. xvii + 908 pp. New York, London: Plenum Press. Price US $175.00 (hard covers). ISBN 0 306 45803 9.
Published online by Cambridge University Press: 01 November 1998
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