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Chemical State Analysis using a Gearless Two-Crystal X-Ray Spectrometer

Published online by Cambridge University Press:  06 March 2019

Tokuzo Konishi ,
Kazuo Nishihagi  and
Kazuo Taniguchi
Tokuzo Konishi
Affiliation:
Analytical Research Center, Asahi Chemical Industry Co., Ltd 2-1 Samejima, Fuji-shi, Shizuoka 416, Japan
Kazuo Nishihagi
Affiliation:
Department of Engineering, Technos Co., Ltd 1-2245-1 Shodaikitamachi, Hirakata-shi, Osaka 573, Japan
Kazuo Taniguchi
Affiliation:
Department of Solid-State Electronics, Faculty of Engineering Osaka Electro-Communication University 18-8 Hathumachi, Neyagawa-shi, Osaka 572, Japan
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Abstract

A two-crystal spectrometer for chemical state analysis by high-resolution x-ray fluorescence spectrometry employs hall-screw and slide mechanisms rather than gears to obtain a 2θ scanning range of 40° -147°; a Δ2θ scanning step of 10−4 deg under vacuus; a 2θ resolution of 10−4 deg in determination of an intercrystal angle with encoder-based measurement; and servomechanical control of position. The spectrometer, although simple in structure, is a powerful instrument for chemical state analysis, as demonstrated by its high resolution, precision, and stability; as demonstrated in the determination of the Kα1 lines of first transition metals with Si(220) as analyzer crystal, and in its application to a systematic study of the chemical effects on Ni Kα1 and Kα2.

Type
VI. XRD Instrumentation, Techniques and Reference Materials
Information
Advances in X-Ray Analysis , Volume 35 , Issue A: First Pacific-International Congress on X-ray Analytical Methods (PICXAM). Fortieth Annual Conference on Applications of X-ray Analysis, August 7-16, 1991 , 1991 , pp. 393 - 399
Copyright
Copyright © International Centre for Diffraction Data 1991

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References

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